Between March 10 and 14, 2025, Professor Neilo Trindade (IFUSP) and PhD student Matheus Cavalcanti (POSMAT/UNESP) carried out a technical visit to the Paul Scherrer Institut (PSI) in Switzerland, where they were hosted by Dr. Eduardo Yukihara, Head of the Radiation Metrology Section. The visit aimed to deepen their knowledge of advanced luminescence techniques applied to the characterization of materials.
During their stay, they performed measurements of thermoluminescence (TL) emission spectra, optically stimulated luminescence (OSL) lifetimes, and photoluminescence spectra from various natural and artificial samples. Using state-of-the-art equipment, such as the Risø TL/OSL reader coupled with a spectrometer and TCSPC system, the participants learned how to calibrate the instruments, acquire data, and conduct analyses focused on defect identification and optimization of readout procedures for dosimetry applications.
The program also included technical discussions on the results, data interpretation, and prospects for future scientific collaborations. The visitors had the opportunity to tour PSI’s facilities, including the calibration laboratory, strengthening institutional ties and expanding opportunities for joint research initiatives.
